DocumentCode :
2283585
Title :
An improved approach for alternative wires identification
Author :
Chen, Yung-Chih ; Wang, Chun-Yao
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., HsingChu, Taiwan
fYear :
2005
fDate :
2-5 Oct. 2005
Firstpage :
711
Lastpage :
716
Abstract :
Redundancy addition and removal (RAR) is a restructuring technique used in the synthesis and optimization of logic designs and physical designs. It finds alternative wires to replace a given target wire without changing the functionality of the circuit. Previous approaches apply two-stage algorithms for this problem. First, they build up a set of candidate wires for the target wire. Second, they perform redundancy test on each candidate wire to determine if it is an alternative wire. Recently, a one-stage algorithm RAM-FIRE (Chang et al., 2003) is proposed. It conducts three logic implications to identify backward alternative wires without trial-and-error redundancy tests. However, the number of alternative wires it can find is smaller than that obtained by the previous two-stage approaches. Here, we propose an improved one-stage algorithm, which only conducts two logic implications. The experimental results show that compared to RAMFIRE, our approach only requires 83% cpu time on average, while obtaining the same number of backward alternative wires. As extending to finding both backward and forward alternative wires, on average our approach gets 157% improvement with 32% cpu time overhead.
Keywords :
automatic test pattern generation; integrated circuit interconnections; logic circuits; logic design; redundancy; wires; RAM-FIRE; alternative wires identification; logic designs; redundancy addition; redundancy removal; redundancy test; restructuring technique; Automatic test pattern generation; Circuit synthesis; Circuit testing; Computer science; Design optimization; Logic design; Logic testing; Performance evaluation; Redundancy; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Print_ISBN :
0-7695-2451-6
Type :
conf
DOI :
10.1109/ICCD.2005.22
Filename :
1524230
Link To Document :
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