DocumentCode :
2283749
Title :
Enhancing incremental learning/recognition via efficient neighborhood estimation
Author :
Huang, Likun ; Yao, Jianchao ; Tan, Yap-Peng
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
19-23 July 2010
Firstpage :
637
Lastpage :
642
Abstract :
One of problems with incremental learning approaches is that the quality of learning samples cannot be controlled since they are provided on-line. Current incremental learning algorithms ignore the issue by accepting each sample unconditionally and assimilating it into the existing recognition system. However, improper sample, caused by a partial occlusion, badly illumination condition and unusual pose, deteriorates the overall performance of the recognition system significantly. In order to overcome this issue, in this paper, based on hypothesis and verification paradigm, we propose a criterion for sample selection, and present a novel system for automatically evaluating the qualities of new added samples during the incremental learning procedure. Following this, a subspace is learned by using only the samples that are considered to be good after verification. The high computation cost, incurred by inclusion of sample verification into incremental learning framework, is greatly reduced using relative distance filtering. The experimental results demonstrated the superiority of our approach, in both recognition accuracy and robustness.
Keywords :
formal verification; image recognition; learning (artificial intelligence); illumination condition; incremental learning; neighborhood estimation; partial occlusion; recognition system; relative distance filtering; sample selection criterion; Accuracy; Algorithm design and analysis; Face; Matrix decomposition; Resource description framework; Testing; Training; Incremental learning; Neighborhood estimating; Relative distance filtering; Sample selecting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2010 IEEE International Conference on
Conference_Location :
Suntec City
ISSN :
1945-7871
Print_ISBN :
978-1-4244-7491-2
Type :
conf
DOI :
10.1109/ICME.2010.5582922
Filename :
5582922
Link To Document :
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