• DocumentCode
    2283796
  • Title

    Deternunation of the high-voltage dependence of fluke 792A at NIM

  • Author

    Jiangtao Zhang ; Guirong Zhang ; Deshi Zhang

  • Author_Institution
    National Institute or Metrology
  • fYear
    2002
  • fDate
    16-21 June 2002
  • Firstpage
    360
  • Lastpage
    361
  • Abstract
    This paper describes a method of using inductive voltage divider (ND) to determine the voltage dependence of voltage ac-dc transfer standard of Fluke 792A at voltage above 200 V and at frequencies of 50 kHz and 100 Wz. The evaluation of the voltage dependence of the ratio ermr of IVD and the test set-up are described and the preliminary results are repotted.
  • Keywords
    Dielectric losses; Frequency conversion; Impedance; Magnetic cores; Metrology; Neodymium; Q measurement; Resistors; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
  • Conference_Location
    Ottawa, Ontario, Canada
  • Print_ISBN
    0-7803-7242-5
  • Type

    conf

  • DOI
    10.1109/CPEM.2002.1034871
  • Filename
    1034871