Title :
Deternunation of the high-voltage dependence of fluke 792A at NIM
Author :
Jiangtao Zhang ; Guirong Zhang ; Deshi Zhang
Author_Institution :
National Institute or Metrology
Abstract :
This paper describes a method of using inductive voltage divider (ND) to determine the voltage dependence of voltage ac-dc transfer standard of Fluke 792A at voltage above 200 V and at frequencies of 50 kHz and 100 Wz. The evaluation of the voltage dependence of the ratio ermr of IVD and the test set-up are described and the preliminary results are repotted.
Keywords :
Dielectric losses; Frequency conversion; Impedance; Magnetic cores; Metrology; Neodymium; Q measurement; Resistors; Testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034871
