Title :
Fast reversed DC measurements using a NbN/TiN/NbN Josephson junction array
Author :
Sasaki, H. ; Yamamori, H. ; Fujiki, H. ; Shoji, A.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
Abstract :
Fast-reversed DC (FRDC) measurements were performed using a NbN/TiN/NbN Josephson junction array developed at AIST. The Josephson junction array was utilized as an auxiliary voltage-stabilizer for a conventional semiconductor FRDC source. The FRDC-DC difference of a thermal converter was measured either with or without the use of the Josephson voltage-stabilizer. The level of agreement between the two configurations was measured to be better than 1 part in 10/sup 7/.
Keywords :
convertors; measurement standards; niobium compounds; superconducting junction devices; titanium compounds; voltage measurement; voltage regulators; FRDC measurements; Josephson voltage-stabilizers; NbN-TiN-NbN; NbN/TiN/NbN Josephson junction array; fast reversed DC measurements; semiconductor FRDC source; thermal converter FRDC- DC difference measurements; voltage standards; Frequency measurement; Josephson junctions; Microwave measurements; NIST; Semiconductor device measurement; Switching converters; Thermoelectricity; Tin; Voltage; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034872
