• DocumentCode
    2283864
  • Title

    Classification of Hyperspectral Image with Feature Selection and Parameter Estimation

  • Author

    Gao, Hengzhen ; Mandal, Mrinal K. ; Wan, Jianwei

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    1
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    783
  • Lastpage
    786
  • Abstract
    This paper presents a new method for hyperspectral image classification. It combines support vector machine (SVM), particle swarm optimization (PSO), and genetic algorithm (GA) together. Its aim is to improve the classification accuracy and reduce the computation consumption based on heuristic algorithms. Because the classification accuracy is impacted by the parameters of the SVM model and feature space in the training and testing steps. In order to optimize the parameters and feature subset, our proposed technique integrates the GA operators into PSO. The effectiveness of the proposed system is carried out on a real hyperspectral data set. Comparison for the classification performance with other reference classifiers is also reported. The obtained results clearly confirm the superiority of the proposed hybrid algorithm.
  • Keywords
    feature extraction; genetic algorithms; image classification; parameter estimation; particle swarm optimisation; support vector machines; computation consumption reduction; feature selection; genetic algorithm; heuristic algorithm; hyperspectral image classification; parameter estimation; particle swarm optimization; support vector machine; Electric variables measurement; Genetic algorithms; Hyperspectral imaging; Hyperspectral sensors; Kernel; Paper technology; Parameter estimation; Particle swarm optimization; Support vector machine classification; Support vector machines; feature selection; genetic algorithm; parameter estimation; particle swarm optimization; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.765
  • Filename
    5458944