DocumentCode :
2283864
Title :
Classification of Hyperspectral Image with Feature Selection and Parameter Estimation
Author :
Gao, Hengzhen ; Mandal, Mrinal K. ; Wan, Jianwei
Author_Institution :
Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
Volume :
1
fYear :
2010
fDate :
13-14 March 2010
Firstpage :
783
Lastpage :
786
Abstract :
This paper presents a new method for hyperspectral image classification. It combines support vector machine (SVM), particle swarm optimization (PSO), and genetic algorithm (GA) together. Its aim is to improve the classification accuracy and reduce the computation consumption based on heuristic algorithms. Because the classification accuracy is impacted by the parameters of the SVM model and feature space in the training and testing steps. In order to optimize the parameters and feature subset, our proposed technique integrates the GA operators into PSO. The effectiveness of the proposed system is carried out on a real hyperspectral data set. Comparison for the classification performance with other reference classifiers is also reported. The obtained results clearly confirm the superiority of the proposed hybrid algorithm.
Keywords :
feature extraction; genetic algorithms; image classification; parameter estimation; particle swarm optimisation; support vector machines; computation consumption reduction; feature selection; genetic algorithm; heuristic algorithm; hyperspectral image classification; parameter estimation; particle swarm optimization; support vector machine; Electric variables measurement; Genetic algorithms; Hyperspectral imaging; Hyperspectral sensors; Kernel; Paper technology; Parameter estimation; Particle swarm optimization; Support vector machine classification; Support vector machines; feature selection; genetic algorithm; parameter estimation; particle swarm optimization; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
Type :
conf
DOI :
10.1109/ICMTMA.2010.765
Filename :
5458944
Link To Document :
بازگشت