• DocumentCode
    2283932
  • Title

    Switching limits in nano-electronic devices

  • Author

    Li, Lijun ; Unluer, Dincer ; Kabir, Mehdi ; Tseng, Frank ; Stan, Mircea R. ; Ghosh, Avik W.

  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    Present day CMOS transistors operate by thermionic emission of electrons over a gate tunable barrier. The fundamental switching energy for each such switching event can be derived from equilibrium thermodynamic considerations. While clever ways can sometimes mitigate the power budget, more often than not, this involves trade-offs with short channel effects (variability), on-off ratio (reliability) and mobility (switching speed). We discuss switching paradigms that venture beyond the near-equilibrium operation of transistors involving the absence or presence of charges as the digital switching bits. To this end, a few case studies are presented. Dipolar switching is invoked as an example to show how gating non-electronic degrees of freedom can reduce the subthreshold swing below the textbook limit by acting as an added cut-off filter on the current. We discuss how new state variables may be engineered into a CMOS platform to enable such non-electronic switching. Another, completely different direction involves non-equilibrium switching, such as a ratchet that allows us to move charges unidirectionally without a drain bias, by using instead an always present AC clock signal adiabatically coupled with the gate.
  • Keywords
    CMOS digital integrated circuits; clocks; integrated circuit reliability; nanoelectronics; nonequilibrium thermodynamics; semiconductor device reliability; switching; thermionic electron emission; AC clock signal-gate adiabatic coupling; CMOS transistors; current cut-off filter; device reliability; device variability; digital switching bits; dipolar switching; gate tunable barrier; mobility; nanoelectronic devices; nonelectronic degrees of freedom gating; nonequilibrium switching; on-off ratio; power budget; power dissipation; ratchet switching; short channel effects; state variables; subthreshold swing; switching energy; switching limit; switching paradigms; switching speed; thermionic electron emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697728
  • Filename
    5697728