Title :
Non-Volatile semiconductor memories for nano-scale technology
Author :
Pellizzer, Fabio ; Bez, Roberto
Author_Institution :
Process R&D, Micron, Agrate Brianza, Italy
Abstract :
In this paper we will review the evolution of Non-Volatile Memories (NVM) through the last decades, driven by a continuous introduction of new materials that helped the reduction of the single cell area and so the cost of the memory. As we entered into the sub-20 nm realm, limitations are appearing for Flash memories and alternative physical mechanisms are proposed to store information in high density media. In this scenario, Phase Change Memory (PCM) is demonstrating the capability to enter the broad memory market and to become a mainstream technology.
Keywords :
flash memories; nanoelectronics; phase change memories; reviews; storage media; NVM; PCM; flash memories; high density media; nanoscale technology; nonvolatile semiconductor memories; phase change memory; physical mechanisms; review; single cell area reduction;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2010.5697736