Title :
Interlaboratory comparison using a transport Josephson voltage standard system
Author :
Tang, Y. ; Kupferman, S.L. ; Salazar, M.T.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A portable Josephson voltage standard (JVS) system has been used as a transfer standard to make an interlaboratory JVS comparison. The results are compared with an interlaboratory comparison between the same two JVS systems using transport Zeners made at about the same time. The portable JVS improves the uncertainty of the comparison by largely eliminating the problem associated with non-ideal Zener transportability, environmental dependence, and non-linear drift.
Keywords :
Josephson effect; Zener effect; superconducting junction devices; transfer standards; voltage measurement; environmental dependence; interlaboratory JVS comparison; nonideal Zener transportability; nonlinear drift; portable Josephson voltage standard system; transport Josephson voltage standard system; transport Zeners; voltage transfer standard; Automatic control; Calibration; Control systems; Laboratories; Measurement standards; NASA; NIST; Switches; US Department of Energy; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034888
