Title :
Extension of the IEN traceability for AC voltages below 200 mV
Author :
Pogliano, U. ; Bosco, G.C. ; D´Elia, Vincenzo
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
Abstract :
The system, the standards and the procedures developed at IEN for the extension of the traceability to low voltage ranges down to 1 mV are described. Specific new features are the low voltage generator system, the procedures for building the traceability and the method for the evaluation of the load correction based on perturbations with known admittances.
Keywords :
load regulation; measurement standards; perturbation techniques; voltage measurement; 1 mV; AC voltages; IEN procedures; IEN standards; IEN traceability extension; load correction evaluation; low voltage generator system; low voltage ranges; perturbation admittances; traceability; Analog-digital conversion; Batteries; Calibration; Inductors; Low voltage; Potentiometers; Resistors; Standards development; Switches; Thermal resistance;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034891
