Title :
Report on CCEM-K2 comparison of 10 M/spl Omega/ and 1 G/spl Omega/ resistance standards
Author :
Jarrett, D.G. ; Dziuba, R.F.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
An international comparison of DC resistance at 10 M/spl Omega/ and 1 G/spl Omega/ was organized under the auspices of the Comite Consultatif d´Electricite et Magnetisme (CCEM) and piloted by the National Institute of Standards and Technology (NIST) with 14 other national metrology institutes (NMIs) participating. Results from the comparison are reported.
Keywords :
electric resistance measurement; measurement standards; 1 Gohm; 10 Mohm; Comite Consultatif d´Electricite et Magnetisme; NIST; NMI; National Institute of Standards and Technology; international CCEM-K2 comparison; national metrology institutes; resistance standards; Bars; Electric resistance; Measurement standards; NIST; Particle measurements; Protection; Statistical analysis; US Department of Commerce; US Government; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034897
