DocumentCode :
2284277
Title :
Correlation between surface degradation and PD wave shape evolution for spherical voids
Author :
Garcia-Colon H., V.R.
Author_Institution :
Inst. de Investigaciones Electr., Morelos
fYear :
1996
fDate :
23-26 Sep 1996
Firstpage :
317
Lastpage :
321
Abstract :
The present study reports the recording of partial discharges (PDs) wave shapes using ultra wide band (UWB) techniques and its relation to the surface degradation produced on the surface of a single spherical void. The spherical void was occluded in epoxy resin at the time of molding the sample. The surface degradation was studied by optical and electron scanning microscopy (SEM) showing that the evolution of localized degradation was related to the pulse shape detected on the UWB system. These degradation zones evolved into a tree. This tree is also presented on optical microscopy photographs. Analysis of the wave shape at UWB can therefore correlate directly to ageing and ultimate failure of polymerical insulation
Keywords :
epoxy insulation; PD wave shape; UWB pulse shape; ageing; epoxy resin; failure; molding; optical microscopy; partial discharge; polymeric insulation; scanning electron microscopy; spherical void; surface degradation; tree; ultra wide band measurement;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Dielectric Materials, Measurements and Applications, Seventh International Conference on (Conf. Publ. No. 430)
Conference_Location :
Bath
ISSN :
0537-9989
Print_ISBN :
0-85296-670-9
Type :
conf
DOI :
10.1049/cp:19961049
Filename :
607408
Link To Document :
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