• DocumentCode
    2284296
  • Title

    An extraction-free circuit simulator of linear complexity guided by electromagnetics-based first principles

  • Author

    He, Qing ; Chen, Duo ; Jiao, Dan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The prevailing circuit simulation paradigm heavily relies on extraction to perform circuit simulation. In addition, no linear complexity has been reported by existing circuit simulation approaches. In this work, we develop a circuit simulator that bypasses the step of extraction. It produces an RLC (resistor-inductor-capacitor) representation of the linear network without any numerical computation. Such a representation is inherently passive and stable. In addition, it allows for the simulation of a circuit including both nonlinear devices and the linear network in linear complexity. The proposed circuit simulator rigorously captures the coupling between nonlinear circuits and the linear network. As an added bonus, it possesses electromagnetic-physics based accuracy. Application to very large-scale on-chip circuits involving close to 1 million CMOS transistors and interconnects having hundreds of millions of unknowns has demonstrated the superior performance of the proposed extraction-free circuit simulator.
  • Keywords
    CMOS integrated circuits; VLSI; capacitors; circuit simulation; inductors; integrated circuit interconnections; resistors; CMOS transistors; circuit simulation paradigm; coupling; electromagnetic-physics; electromagnetics-based first principles; extraction-free circuit simulator; interconnects; linear complexity; linear network; nonlinear circuits; resistor-inductor-capacitor representation; very large-scale on-chip circuits; Circuit simulation; Complexity theory; Computational modeling; Integrated circuit modeling; Mathematical model; Nonlinear circuits; RLC circuits; Circuit simulation; electromagnetic analysis; linear complexity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2011 IEEE
  • Conference_Location
    Hanzhou
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4673-2288-1
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2011.6213766
  • Filename
    6213766