DocumentCode :
2284302
Title :
Surface plasmon resonance characteristics of Au/Cr thin films grown on glass substrate
Author :
Perumal, Premchander ; Lee, Yong Tak
Author_Institution :
Dept. of Inf. & Commun., Gwangju Inst. of Sci. & Technol. (GIST), Gwangju, South Korea
fYear :
2010
fDate :
17-20 Aug. 2010
Firstpage :
271
Lastpage :
274
Abstract :
Gold (Au) nanoparticles were fabricated on Chrome (Cr) thin film to glass substrate by slow-rate of e-beam evaporation method. Gold nanoparticles were identified by using scanning electron microscopy, atomic force microscopy and energy dispersive X-ray spectroscopy measurements. Au and Cr-peaks were confirmed by single crystal X-ray diffraction measurements. Energy dispersive X-ray and UV-spectroscopy measurements revealed that the elemental compositions, absorbance, transmission and reflectance of Au/Cr thin-films deposited on glass substrate, respectively. Au layers with thickness of about 1, 5 and 10 nm were deposited by e-beam evaporation method on unheated glass substrates coated with a Cr layer about 30 nm thick. Owing to the surface plasmon resonance effect, gold nanoparticles on Cr/glass have strong extinction absorbance from 400 to 600 nm wavelength regions for 5 and 10 nm thick of gold thin films deposited on glass substrates.
Keywords :
X-ray chemical analysis; X-ray diffraction; atomic force microscopy; chromium; electron beam deposition; extinction coefficients; gold; metallic thin films; nanofabrication; nanoparticles; reflectivity; scanning electron microscopy; surface plasmon resonance; ultraviolet spectra; vacuum deposition; visible spectra; Au-Cr; SiO2; UV-spectroscopy; atomic force microscopy; e-beam evaporation method; elemental composition; energy dispersive X-ray spectroscopy; extinction absorbance; glass substrate; gold nanoparticles; reflectance; scanning electron microscopy; single crystal X-ray diffraction; surface plasmon resonance; thin films; wavelength 400 nm to 600 nm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
ISSN :
1944-9399
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2010.5697750
Filename :
5697750
Link To Document :
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