• DocumentCode
    2284356
  • Title

    Beyond face: Improving person clustering in consumer photos by exploring contextual information

  • Author

    Zhang, Wei ; Zhang, Tong ; Tretter, Daniel

  • Author_Institution
    Hewlett-Packard Labs., Palo Alto, CA, USA
  • fYear
    2010
  • fDate
    19-23 July 2010
  • Firstpage
    1540
  • Lastpage
    1545
  • Abstract
    Automatic person clustering, which groups photos based on the individuals appearing in a photo collection, is a key component to facilitate photo management and sharing. Traditionally, person clusters are basically built by detecting faces and matching facial features. But these facial clusters can perform poorly when there are large pose variations and occlusions, which are not uncommon in consumer photos. In this paper, we propose an approach that employs contextual information to complement facial information in order to significantly improve the performance of person clustering. The proposed system is able to detect human skin, hair and clothing regions and extract features robustly. By matching the features, high-precision contextual clusters are obtained which can automatically link together multiple face clusters of the same person for efficient annotation. Promising results on family photo collections demonstrated the effectiveness of our approach.
  • Keywords
    digital photography; face recognition; feature extraction; image matching; pattern clustering; pose estimation; automatic person clustering; consumer photos; contextual information; face detection; facial clusters; facial features matching; facial information; family photo collections; feature extraction; high-precision contextual clusters; occlusions; person clusters; photo management; photo sharing; pose variations; Clothing; Clustering algorithms; Color; Face; Feature extraction; Measurement; Skin; clothes matching; cluster fusion; contextual feature; face recognition; person clustering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2010 IEEE International Conference on
  • Conference_Location
    Suntec City
  • ISSN
    1945-7871
  • Print_ISBN
    978-1-4244-7491-2
  • Type

    conf

  • DOI
    10.1109/ICME.2010.5582955
  • Filename
    5582955