DocumentCode :
2284396
Title :
Evaluation of solenoidal and statistically enhanced total current densities in multi-particle Monte Carlo device simulators
Author :
Graf, P. ; Keith, S. ; Meinerzhagen, B.
Author_Institution :
Inst. fur Theor. Elektrotech. und Mikroelektronik, Bremen Univ., Germany
fYear :
1997
fDate :
8-10 Sept. 1997
Firstpage :
221
Lastpage :
224
Abstract :
For noise analysis and transient Monte Carlo simulations the evaluation not only of the conduction current but also of the displacement current is necessary. The simulated total terminal currents should be solenoidal, but this basic property is often lost in the discretization process. Here a consistent discretization of the conduction current densities and Poisson´s equation is presented which yields solenoidal currents. The new method does not require more CPU time than previous methods, but yields terminal currents with a considerably better signal to noise ratio than former methods. Results are shown for stationary and transient simulations and discussed.
Keywords :
Monte Carlo methods; Poisson distribution; current density; semiconductor device models; semiconductor device noise; transient analysis; Poisson´s equation; conduction current; conduction current densities; discretization process; displacement current; multi-particle Monte Carlo device simulators; noise analysis; signal to noise ratio; solenoidal current densities; stationary simulations; statistically enhanced total current densities; terminal currents; transient Monte Carlo simulations; Analytical models; Charge carrier processes; Computational modeling; Current density; Electromagnetic compatibility; Finite difference methods; Monte Carlo methods; Poisson equations; Tensile stress; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on
Conference_Location :
Cambridge, MA, USA
Print_ISBN :
0-7803-3775-1
Type :
conf
DOI :
10.1109/SISPAD.1997.621377
Filename :
621377
Link To Document :
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