• DocumentCode
    2284396
  • Title

    Evaluation of solenoidal and statistically enhanced total current densities in multi-particle Monte Carlo device simulators

  • Author

    Graf, P. ; Keith, S. ; Meinerzhagen, B.

  • Author_Institution
    Inst. fur Theor. Elektrotech. und Mikroelektronik, Bremen Univ., Germany
  • fYear
    1997
  • fDate
    8-10 Sept. 1997
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    For noise analysis and transient Monte Carlo simulations the evaluation not only of the conduction current but also of the displacement current is necessary. The simulated total terminal currents should be solenoidal, but this basic property is often lost in the discretization process. Here a consistent discretization of the conduction current densities and Poisson´s equation is presented which yields solenoidal currents. The new method does not require more CPU time than previous methods, but yields terminal currents with a considerably better signal to noise ratio than former methods. Results are shown for stationary and transient simulations and discussed.
  • Keywords
    Monte Carlo methods; Poisson distribution; current density; semiconductor device models; semiconductor device noise; transient analysis; Poisson´s equation; conduction current; conduction current densities; discretization process; displacement current; multi-particle Monte Carlo device simulators; noise analysis; signal to noise ratio; solenoidal current densities; stationary simulations; statistically enhanced total current densities; terminal currents; transient Monte Carlo simulations; Analytical models; Charge carrier processes; Computational modeling; Current density; Electromagnetic compatibility; Finite difference methods; Monte Carlo methods; Poisson equations; Tensile stress; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on
  • Conference_Location
    Cambridge, MA, USA
  • Print_ISBN
    0-7803-3775-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.1997.621377
  • Filename
    621377