DocumentCode
2284409
Title
Image watermarking using dual-tree complex wavelet by coefficients swapping and group of coefficients quantization
Author
Yang, Huijuan ; Jiang, Xudong ; Kot, Alex C.
Author_Institution
Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
19-23 July 2010
Firstpage
1673
Lastpage
1678
Abstract
In this paper, we present two watermarking schemes for images using the low-pass frequency coefficients and high-pass complex frequency coefficients of the Dual-Tree Complex Wavelet Transform (DT-CWT) of the image, the distinctive characteristics of the two schemes can lead to different applications. We investigate the problem of embedding binary watermark sequence in DT-CWT domain, which is a challenging problem. The coefficients swapping is done by carefully selecting those 2×2 blocks with high-energy in the low frequency and swap the coefficients that lie in the median range in the block to embed the watermark. Whereas the group of coefficients quantization quantizes a group of high-pass complex frequency coefficients to make the quantized coefficients lie in the middle of the quantization range and distribute the changes among the coefficients. Experimental results conducted on 100 standard images achieve about 96% and 92% detection rate for the low-pass and high-pass frequency coefficients-based schemes, respectively. Robustness tests against some common signal processing attacks such as additive noise, median filtering and lossy JPEG compression confirm the superior performance of the proposed schemes.
Keywords
image coding; watermarking; wavelet transforms; coefficients quantization; coefficients swapping; dual-tree complex wavelet transform; high-pass complex frequency coefficients; image watermarking; low-pass frequency coefficients; Image edge detection; PSNR; Quantization; Robustness; Transforms; Visualization; Watermarking; coefficients swapping; dual-tree complex wavelet; group of coefficients quantization; robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia and Expo (ICME), 2010 IEEE International Conference on
Conference_Location
Suntec City
ISSN
1945-7871
Print_ISBN
978-1-4244-7491-2
Type
conf
DOI
10.1109/ICME.2010.5582958
Filename
5582958
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