• DocumentCode
    2284441
  • Title

    A Design for Failure Analysis (DFFA) Technique to Ensure Incorruptible Signatures

  • Author

    Kundu, Sandip

  • Author_Institution
    Dept. of ECE, Massachusetts Univ., Amherst, MA
  • Volume
    1
  • fYear
    2006
  • fDate
    6-10 March 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Fast failure analysis is a key enabler in shortening the time between design tape out and product introduction in the market. With faster detection of manufacturability issues, problems associated with parametric variations, model approximations or physical design rules can be fixed faster either at the process control level or at the mask level. Failure analysis can be accelerated with additional hardware support for design-for-testability (DFT) and design-for-failure-analysis (DFFA). In this paper, we focus on one such DFFA technique deployed in the industry, identify its shortcomings and offer improvements to fix deficiencies
  • Keywords
    design for manufacture; design for testability; failure analysis; design tape out; design-for-failure-analysis; design-for-testability; incorruptible signatures; mask level; model approximations; parametric variations; physical design rules; process control level; Acceleration; Clocks; Counting circuits; Debugging; Failure analysis; Hardware; Manufacturing processes; Process control; Registers; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    3-9810801-1-4
  • Type

    conf

  • DOI
    10.1109/DATE.2006.244174
  • Filename
    1656896