Title :
Modeling of trajectories in an electrodynamic screen for obtaining maximum particle removal efficiency
Author :
Horenstein, Mark N. ; Mazumder, Malay K. ; Sumner, Robert C. ; Stark, Jeremy ; Abuhamed, Tareq ; Boxman, Raymond
Author_Institution :
Boston Univ., Boston, MA, USA
Abstract :
An electrostatic self-cleaning panel for solar collectors is described. An electrodynamic screen is formed by inter-digitated, transparent surface electrodes energized by three-phase, low-frequency ac voltages in the range 5 to 200 Hz and 500 to 1000 V. The resulting electrostatic field wave exerts force on the particles and sweeps them laterally across the panel. Particle trajectories are simulated to help ascertain parameters for maximum dust-removal efficiency. The electric field of the electrodynamic screen is found by a Fourier expansion of Laplace´s equation solutions for a surface potential that is periodic in space and time. Trajectories are found for particles of various size and charge, and electrode excitations; these are compared qualitatively to experimental observations. One unexpected result is the chaotic behavior of larger particles which jump sporadically back and forth and only slowly migrate in the direction of the impressed electrostatic surface wave.
Keywords :
Fourier transforms; Laplace equations; electric fields; electrodynamics; electrostatics; solar absorber-convertors; Fourier expansion; Laplace equation solutions; chaotic behavior; electric field; electrode excitations; electrodynamic screen; electrostatic field wave; electrostatic self-cleaning panel; frequency 5 Hz to 200 Hz; impressed electrostatic surface wave; interdigitated surface electrodes; maximum dust-removal efficiency; maximum particle removal efficiency; particle trajectories; solar collectors; transparent surface electrodes; voltage 500 V to 1000 V; Educational institutions; dust; efficiency; electrodynamic; electrostatic; screen; self-cleaning; solar; trajectories;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2011 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-9498-9
DOI :
10.1109/IAS.2011.6074264