Title :
A compact heterodyne refractometer at 633 nm
Author :
Topcu, S. ; Wallerand, J.-P. ; Allayli, Y. ; Juncar, P.
Author_Institution :
Lab. CISTEC, Univ. de Versailles Saint Quentin, France
Abstract :
We present the results obtained with a compact heterodyne refractometer at 633 nm based on the measurement of the frequency of a laser diode locked to a Fabry Perot cavity, by comparison with a He-Ne laser. An agreement with Edlen´s formulas has been obtained at the level of 4/spl times/10/sup -8/, limited by the accuracy of these formulas. The principle of this instrument is similar to the refractometer already developed in our laboratory and working at 780 nm (N. Khelifa et al, Appl. Opt., vol. 37, pp. 156-161, 1998). This apparatus may be also used as an air wavelength reference as described in ref. (R. Thibout et al, Eur. Phys. J. AP., vol. 16, pp. 239-245, 2001).
Keywords :
Fabry-Perot interferometers; air; frequency measurement; gas lasers; heterodyne detection; laser mode locking; laser variables measurement; refractive index measurement; refractometers; semiconductor lasers; 633 nm; 780 nm; Edlen´s formulas accuracy limitations; Fabry Perot cavity locked laser diode; He-Ne; He-Ne laser; air refractive index measurement; air wavelength reference; compact heterodyne refractometer; laser frequency measurement; refractometer operating wavelength; Atmospheric measurements; Calibration; Diode lasers; Frequency measurement; Measurement standards; Optical interferometry; Optical refraction; Particle measurements; Refractive index; Temperature;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034926
