A compact heterodyne refractometer at 633 nm

Author

Topcu, S. ; Wallerand, J.-P. ; Allayli, Y. ; Juncar, P.

Author_Institution

Lab. CISTEC, Univ. de Versailles Saint Quentin, France

fYear

2002

fDate

16-21 June 2002

Firstpage

470

Lastpage

471

Abstract

We present the results obtained with a compact heterodyne refractometer at 633 nm based on the measurement of the frequency of a laser diode locked to a Fabry Perot cavity, by comparison with a He-Ne laser. An agreement with Edlen´s formulas has been obtained at the level of 4/spl times/10/sup -8/, limited by the accuracy of these formulas. The principle of this instrument is similar to the refractometer already developed in our laboratory and working at 780 nm (N. Khelifa et al, Appl. Opt., vol. 37, pp. 156-161, 1998). This apparatus may be also used as an air wavelength reference as described in ref. (R. Thibout et al, Eur. Phys. J. AP., vol. 16, pp. 239-245, 2001).

Keywords

Fabry-Perot interferometers; air; frequency measurement; gas lasers; heterodyne detection; laser mode locking; laser variables measurement; refractive index measurement; refractometers; semiconductor lasers; 633 nm; 780 nm; Edlen´s formulas accuracy limitations; Fabry Perot cavity locked laser diode; He-Ne; He-Ne laser; air refractive index measurement; air wavelength reference; compact heterodyne refractometer; laser frequency measurement; refractometer operating wavelength; Atmospheric measurements; Calibration; Diode lasers; Frequency measurement; Measurement standards; Optical interferometry; Optical refraction; Particle measurements; Refractive index; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on

Conference_Location

Ottawa, Ontario, Canada

Print_ISBN

0-7803-7242-5

Type

conf

DOI

10.1109/CPEM.2002.1034926

Filename

1034926