DocumentCode :
2284991
Title :
Research on TSV positioning in 3D IC placement
Author :
Ligang Hou ; Shu Bai ; Jinhui Wang
Author_Institution :
VLSI & Syst. Lab., Beijing Univ. of Technol., Beijing, China
fYear :
2011
fDate :
12-14 Dec. 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper forwards two TSV positioning algorithm named middle-cut positioning (MCP) and optimized area positioning (OAP). In 3D IC placement, TSV occupies cell area and its position does affect the real wire length which is ignored in previous works. Its effect should be considered by TSV based wirelength calculation and TSV positioning. Experiments are carried out on 2D-3D transformation of IBM benchmark circuits. Results shows that OAP outrun MCP, which optimized total wirelength in 15 out of 17 benchmark circuits, in which best optimized 11.81%.
Keywords :
three-dimensional integrated circuits; 2D-3D transformation; 3D IC placement; IBM benchmark circuit; MCP; OAP; TSV based wirelength calculation; TSV positioning; middle-cut positioning; optimized area positioning; Benchmark testing; Design automation; Integrated circuit modeling; Solid modeling; Three dimensional displays; Through-silicon vias;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2011 IEEE
Conference_Location :
Hanzhou
ISSN :
2151-1225
Print_ISBN :
978-1-4673-2288-1
Electronic_ISBN :
2151-1225
Type :
conf
DOI :
10.1109/EDAPS.2011.6213801
Filename :
6213801
Link To Document :
بازگشت