DocumentCode :
2285190
Title :
New generation of quantum Hall array resistance standards
Author :
Poirier, W. ; Bounouh, A. ; Piquernal, F. ; Andre, J.P.
Author_Institution :
BNM-LNE, Fontenay-aux-Roses, France
fYear :
2002
fDate :
16-21 June 2002
Firstpage :
534
Lastpage :
535
Abstract :
New quantum Hall array resistance standards (QHARS) with nominal values ranging from R/sub K//200 to 50R/sub K/ (i=2 plateau) have been developed. First results show that R/sub K//200 (/spl sim/129 /spl Omega/) and 16R/sub K//4130 (/spl sim/100 /spl Omega/) standards have Hall resistances which agree with their nominal values within 5 parts in 10/sup 9/ (1/spl sigma/) when supplied by currents up to 4 mA.
Keywords :
electric resistance measurement; measurement standards; quantum Hall effect; 0 to 4 mA; 100 ohm; 129 ohm; Hall resistances; QHARS; nominal values; quantum Hall array; resistance standards; resistance unit; Bars; Current supplies; Fabrication; Insulation; Magnetic analysis; Magnetic field measurement; Metrology; Standards development; Voltage; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
Type :
conf
DOI :
10.1109/CPEM.2002.1034958
Filename :
1034958
Link To Document :
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