Effects of metallic gates on AC quantum Hall measurements

Author

Overney, F. ; Jeanneret, Blaise ; Jeckelmann, B.

Author_Institution

Swi&-, Fed. Office of Metrol. & Accreditation, Bern, Switzerland

fYear

2002

fDate

16-21 June 2002

Firstpage

540

Lastpage

541

Abstract

Using a sample with back-gates, a linear frequency dependence of the AC quantum Hall resistance was observed on the plateau i=2 for frequencies ranging from 800 Hz to 5 kHz. The frequency coefficient, and the current dependence of R/sub H/ which depend on potentials applied to the back-gates, can simultaneously be reduced to zero. More interestingly, it is also shown that, by removing these back-gates, the losses are considerably reduced giving a negligible frequency coefficient on the order of (0.006/spl plusmn/0.030) (/spl mu//spl Omega///spl Omega/)/kHz.

Keywords

bridge instruments; electric resistance measurement; measurement standards; quantum Hall effect; resistors; 800 Hz to 5 kHz; AC bridge; AC quantum Hall measurements; AC quantum Hall resistance; back-gate potential; back-gate removal; current dependence; frequency coefficient; linear frequency dependence; metallic gate effect; Bridge circuits; Cables; Capacitors; Frequency dependence; Leakage current; Magnetic field measurement; Resistors; Roentgenium; Shape measurement; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on

Conference_Location

Ottawa, Ontario, Canada

Print_ISBN

0-7803-7242-5

Type

conf

DOI

10.1109/CPEM.2002.1034961

Filename

1034961