• DocumentCode
    2285252
  • Title

    Molecular dynamics simulations of LATID implants into silicon

  • Author

    Oldiges, P. ; Huilong Zhu ; Nordlund, K.

  • Author_Institution
    Digital Equipment Corp., Hudson, MA, USA
  • fYear
    1997
  • fDate
    8-10 Sept. 1997
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    Molecular dynamics simulations of Large-Angle-Tilt Implanted Drain technology are shown. Calculation results are shown of ion range variation as function of implant angle over the entire spectrum of possible implant angles. Through this calculation, it is possible to determine the optimal angles for large tilt angle implants. The simulator also allows for the definition of amorphous layers over a crystalline substrate. Results of these calculations accurately predict effects such as paradoxical profile broadening.
  • Keywords
    elemental semiconductors; ion implantation; molecular dynamics method; semiconductor process modelling; silicon; LATID implantation; Si; amorphous layer; crystalline substrate; implant angle; ion range; large-angle-tilt implanted drain technology; molecular dynamics simulation; profile broadening; silicon; Amorphous materials; Atomic layer deposition; Atomic measurements; Automotive materials; Crystallization; Implants; Laboratories; Nuclear electronics; Potential energy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on
  • Conference_Location
    Cambridge, MA, USA
  • Print_ISBN
    0-7803-3775-1
  • Type

    conf

  • DOI
    10.1109/SISPAD.1997.621383
  • Filename
    621383