Title :
Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant
Author :
Fujii, K. ; Waseda, A. ; Kuramoto, N. ; Tanaka, M. ; Valkiers, S. ; Taylor, P. ; Kessel, R. ; De Bievre, P.
Author_Institution :
Nat. Metrol. Inst. of Japan, Agency of Ind. Sci. & Technol., Ibaraki, Japan
Abstract :
For a determination of the Avogadro constant N/sub A/ by the X-ray crystal density (XRCD) method, the molar volume M//spl rho/ of three different silicon crystals, NRLM1, NRLM2, and NRLM4, have been analyzed systematically by measurements of their densities /spl rho/ and molar masses M. Details on the sample preparations and the result of measurement are presented.
Keywords :
X-ray crystallography; constants; crystals; density measurement; elemental semiconductors; silicon; Avogadro constant determination; NRLM1; NRLM2; NRLM4; Si; Si crystals; X-ray crystal density method; molar volume evaluation; sample preparations; Atomic measurements; Conducting materials; Crystalline materials; Crystals; Density measurement; Isotopes; Metrology; Optical interferometry; Silicon; Volume measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location :
Ottawa, Ontario, Canada
Print_ISBN :
0-7803-7242-5
DOI :
10.1109/CPEM.2002.1034970
