DocumentCode :
2285471
Title :
Spatially and temporally resolved EUV emissions from SATURN Z-pinches
Author :
Nash, T.J. ; Breeze, S. ; Mock, R. ; Jobe, D.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
208
Abstract :
Summary form only given, as follows. EUV emissions can be used to measure several Z-pinch parameters. We have measured implosion velocity from Doppler splitting of lines and estimated electron temperature during run-in from the mean ionization state of line emissions. In an argon pinch we measure an electron temperature of 100 eV before stagnation. To date doppler split lines have measured implosion velocities less than 40 cm/microsecond. We are presently attempting to measure magnetic field or load current from Zeeman splitting and it may be possible to measure electron density from a Stark-broadened line. Opacity and ion thermal broadening may also contribute to line width information. The spectrometer utilizes a variable line space grating to give a flat focal field. Spectral resolution with a 60 micron detector resolution is up to 3000 and generally increases with wavelength. This is sufficient to detect several plasma line broadening mechanisms. The spectrometer may detect lines above 100 /spl Aring/ and below 1400 /spl Aring/. Spectral range across a microchannel plate stripline detector decreases with increasing wavelength setting. We may gate two striplines with 1 to 12 nsec gates at any time during the pinch discharge. Each stripline spatially images the pinch diameter perpendicular to the direction of dispersion. Spatial resolution in the pinch diameter is 1 mm. Spatial acquisition along the Z axis is also 1 mm. We will present data from argon, krypton, and aluminum Z-pinch discharges on the SATURN accelerator.
Keywords :
Z pinch; electron density; plasma diagnostics; plasma temperature; temperature; 100 eV; 100 to 1400 A; Al; Ar; Ar pinch; Doppler line splitting; Kr; SATURN Z-pinches; Stark-broadened line; Zeeman splitting; electron density; electron temperature; implosion velocities; implosion velocity; ion thermal broadening; ionization state; line emissions; line width information; microchannel plate stripline detector; opacity; pinch discharge; plasma line broadening; spatially resolved EUV emissions; spectral resolution; temporally resolved EUV emissions; variable line space grating; Argon; Density measurement; Electrons; Magnetic field measurement; Plasma temperature; Saturn; Spatial resolution; Stripline; Temperature measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.531741
Filename :
531741
Link To Document :
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