Performance analysis of OSTBC in gamma-gamma fading channels

Author

Lee, Eunju ; Yoon, Giwan ; Park, Jaedon ; Kim, Suil

Author_Institution

Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Tech. (KAIST), Daejeon, South Korea

fYear

2012

fDate

1-4 April 2012

Firstpage

1011

Lastpage

1016

Abstract

The multi-input multi-output (MIMO) system with a subcarrier intensity modulation (SIM) scheme in free-space optics (FSO) has a huge merit for ultra wide band communications mainly due to its diversity gain to be able to mitigate the signal scintillation caused by the atmospheric turbulence. In this study, we have analyzed the performance of the orthogonal space-time block codes (OSTBCs) in FSO links. In particular, the power series expressions of the outage probability and average bit error rate (BER) of the OSTBC for any number of antennas are derived in gamma-gamma fading channels using the SIM scheme. According to the analysis, the 3×2 OSTBC scheme could achieve a significantly high signal-to-noise ratio (SNR) gain of 62.5 dB in a strong turbulence regime, and also a moderately high SNR gain of 48 dB in a moderate turbulence regime over the no diversity at the BER of 10^-6. Monte Carlo simulation results verify the accuracy of our analysis.

Keywords

MIMO communication; diversity reception; error statistics; fading channels; probability; space-time block codes; BER; FSO; MIMO; OSTBC; SIM scheme; SNR; atmospheric turbulence; bit error rate; diversity gain; free-space optics; gain 62.5 dB; gamma-gamma fading channels; high signal-to-noise ratio; multi-input multi-output system; orthogonal space-time block codes; outage probability; signal scintillation; subcarrier intensity modulation scheme; ultra wide band communications; Antennas; Bit error rate; Fading; Gain; Manganese; Probability density function; Signal to noise ratio; free-space optics; gamma-gamma fading; orthogonal space-time block codes;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless Communications and Networking Conference (WCNC), 2012 IEEE

Conference_Location

Shanghai

ISSN

1525-3511

Print_ISBN

978-1-4673-0436-8

Type

conf

DOI

10.1109/WCNC.2012.6213921

Filename

6213921