DocumentCode :
2285596
Title :
Logic circuits using multi-emitter resonant-tunneling hot-electron transistors (RHETs)
Author :
Takatsu, Masaru ; Imamura, Kousuke ; Mori, Takayoshi ; Adachihara, T. ; Muto, Salvatore ; Yokoyama, Naoki
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fYear :
1994
fDate :
16-18 Feb. 1994
Firstpage :
124
Lastpage :
125
Abstract :
Developing functional devices is one way to overcome the increased wire delay and power consumption problems faced by large scale integration. The resonant-tunneling hot-electron transistor (RHET) is a functional device that features a negative differential conductance. A memory cell using resonant-tunneling diodes has been demonstrated but a logic circuit using conventional RHETs has many resistors, which limit speed and scale of integration. However, using multi-emitter RHETs a logic family can be formed which includes: a NAND/NOR gate, a NOR gate, an AND gate, an Ex-NOR gate, a data selector, latches, and flip-flops. The circuits consist of a small number of components since the multi-emitter RHET emitter electrode can be used as a base. Fabrication is less complex and the device structure more flexible than for a single-emitter RHET, because the transistor does not need a base contact. The emitter mesa etching tolerance increases and the base layer range of acceptable thicknesses and doping levels are wider. Since the multi-emitter RHETs can also function as an SRAM cell, logic circuits and SRAM cells can be integrated using the same device structure.<>
Keywords :
combinatorial circuits; flip-flops; hot electron transistors; integrated logic circuits; logic gates; resonant tunnelling devices; sequential circuits; AND gate; Ex-NOR gate; NAND/NOR gate; NOR gate; data selector; emitter mesa etching tolerance; flip-flops; hot-electron transistors; latches; logic circuit; multi-emitter RHETs; multiemitter RHET; negative differential conductance; resonant-tunneling HET; Delay; Diodes; Energy consumption; Large scale integration; Logic circuits; Logic devices; Random access memory; Resistors; Resonant tunneling devices; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-1844-7
Type :
conf
DOI :
10.1109/ISSCC.1994.344704
Filename :
344704
Link To Document :
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