• DocumentCode
    2285596
  • Title

    Logic circuits using multi-emitter resonant-tunneling hot-electron transistors (RHETs)

  • Author

    Takatsu, Masaru ; Imamura, Kousuke ; Mori, Takayoshi ; Adachihara, T. ; Muto, Salvatore ; Yokoyama, Naoki

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • fYear
    1994
  • fDate
    16-18 Feb. 1994
  • Firstpage
    124
  • Lastpage
    125
  • Abstract
    Developing functional devices is one way to overcome the increased wire delay and power consumption problems faced by large scale integration. The resonant-tunneling hot-electron transistor (RHET) is a functional device that features a negative differential conductance. A memory cell using resonant-tunneling diodes has been demonstrated but a logic circuit using conventional RHETs has many resistors, which limit speed and scale of integration. However, using multi-emitter RHETs a logic family can be formed which includes: a NAND/NOR gate, a NOR gate, an AND gate, an Ex-NOR gate, a data selector, latches, and flip-flops. The circuits consist of a small number of components since the multi-emitter RHET emitter electrode can be used as a base. Fabrication is less complex and the device structure more flexible than for a single-emitter RHET, because the transistor does not need a base contact. The emitter mesa etching tolerance increases and the base layer range of acceptable thicknesses and doping levels are wider. Since the multi-emitter RHETs can also function as an SRAM cell, logic circuits and SRAM cells can be integrated using the same device structure.<>
  • Keywords
    combinatorial circuits; flip-flops; hot electron transistors; integrated logic circuits; logic gates; resonant tunnelling devices; sequential circuits; AND gate; Ex-NOR gate; NAND/NOR gate; NOR gate; data selector; emitter mesa etching tolerance; flip-flops; hot-electron transistors; latches; logic circuit; multi-emitter RHETs; multiemitter RHET; negative differential conductance; resonant-tunneling HET; Delay; Diodes; Energy consumption; Large scale integration; Logic circuits; Logic devices; Random access memory; Resistors; Resonant tunneling devices; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1994. Digest of Technical Papers. 41st ISSCC., 1994 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-1844-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.1994.344704
  • Filename
    344704