DocumentCode :
2285752
Title :
"Tandem puff-on-wire" experiments on ACE 4
Author :
Coleman, P.L. ; Loter, N. ; Rauch, J. ; Thompson, J. ; Wessel, F.J. ; Bystritskii, V.M. ; Davison, C.
Author_Institution :
Maxwell Lab. Inc., San Diego, CA, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
210
Abstract :
Summary form only given, as follows. Prior experiments showed enhanced soft (/spl sim/1 keV) and significant hard (6 keV) X-ray output for aluminum plasma jet implosions that included a central metal wire. In an effort to confirm those results and to establish the operative physical processes, we adapted the puff-on-wire geometry to the tandem puff load on the 4 MJ ACE 4 inductive energy storage (IES) machine. Most of our experiments used an 11 centimeter diameter neon gas puff surrounding central fine (25-75 micron diameter) wires of copper, molybdenum, silver and tungsten. In addition to standard soft radiation sensors (calorimeters, XRDs, PCDs, etc.), our diagnostics included a nine channel silicon PIN diode spectrometer covering the range from /spl sim/6 to over 300 keV. Peak current into the load exceeded 3 megamps. We do see increased soft and hard X-ray output when a central wire is in place. Time resolved data show that the soft and hard X-ray components begin at the same time but their evolutions vary with wire atomic number. The time scale of the hard radiation exceeds 100 ns. The hard X-ray yield increases with wire atomic number.
Keywords :
X-ray production; exploding wires; inductive energy storage; pinch effect; plasma diagnostics; 1 keV; 3 MA; 4 MJ; 6 keV; 6 to 300 keV; ACE 4; Ag; Al; Al plasma jet implosions; Cu; Mo; PCD; PIN diode spectrometer; W; X-ray output; XRD; calorimeters; central metal wire; diagnostics; inductive energy storage machine; soft radiation sensors; tandem puff-on-wire experiments; time resolved data; wire atomic number; Aluminum; Atomic measurements; Copper; Energy storage; Geometry; Plasma x-ray sources; Silicon; Silver; Tungsten; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.531744
Filename :
531744
Link To Document :
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