• DocumentCode
    2285957
  • Title

    Formation of 3D Ge quantum dots array for advanced photovolatics in layer-cake technique

  • Author

    Chien, C.Y. ; Chang, Y.R. ; Chang, R.N. ; Lee, M.S. ; Li, W.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jhong Li, Taiwan
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    924
  • Lastpage
    927
  • Abstract
    Placement of quantum dots (QDs) and insight into QD´s basic internal structure and optical properties lay nature cornerstones for advanced photonic devices. We report a manageable growth method for placing dense three-dimensional Ge QD arrays in a uniform or a grading size distribution, using thermal oxidation of poly-SiGe in layer-cake techniques. The QD size and spatial density in each stack could be well modulated by Ge content in poly-Si1-xGex, oxidation and underlay buffer layer conditions. Size-dependent internal structure, strain, and photoluminesce properties of Ge QDs are systematically investigated. Optimization of processing conditions was carried out for producing dense Ge QD arrays for maximizing photovoltaic efficiency.
  • Keywords
    CVD coatings; Ge-Si alloys; elemental semiconductors; germanium; photoelectric devices; photoluminescence; quantum dots; 3D quantum dots array formation; Ge; SiGe; advanced photonic device; advanced photovolatic; grading size distribution; internal structure; layer cake technique; manageable growth method; photoluminesce property; processing condition optimization; quantum dot placement; spatial density; strain; thermal oxidation; underlay buffer layer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697842
  • Filename
    5697842