Title :
Automatic Classification of Power Quality Events Using Multiwavelets
Author :
Dahiya, Surender ; Jain, D.K. ; Kumar, Manish ; Kumar, Ashok ; Kapoor, Rajiv
Author_Institution :
Dept. of Electr. Eng., C.R. State Coll. of Eng., Murthal
Abstract :
Multiwavelets technique is here proposed to classify the power quality (PQ) events. This leads to easy extraction of feature set. In the proposed classification scheme initially the events are detected from the test data in accordance with the IEEE standards. Then, two sub-classifiers, namely, chi-square distribution and heuristic classifier with different confidence levels have been used along with the Dempster-Shafer (DS) class for final decision making.
Keywords :
decision making; feature extraction; power supply quality; wavelet transforms; Dempster-Shafer class; IEEE standard; chi-square distribution; decision making; feature set extraction; multiwavelets technique; power quality event; Feature extraction; Filter bank; Harmonic distortion; Image coding; Multiresolution analysis; Power quality; Power systems; Testing; Voltage; Wavelet analysis; Event Classification; Multiwavelets; Power Quality;
Conference_Titel :
Power Electronics, Drives and Energy Systems, 2006. PEDES '06. International Conference on
Conference_Location :
New Delhi
Print_ISBN :
0-7803-9772-X
Electronic_ISBN :
0-7803-9772-X
DOI :
10.1109/PEDES.2006.344239