DocumentCode
228649
Title
Determining base transit time of anAly Ga1−y As HBT using the analytical model developed for SiGe device with exponentially doped base
Author
Arafat, Yeasir ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Jahan, Nusrat
Author_Institution
Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Tech. (BUET), Dhaka, Bangladesh
fYear
2014
fDate
13-14 Feb. 2014
Firstpage
1
Lastpage
5
Abstract
Base transit time (BTT) of a graded base AlGaAs Heterojunction Bipolar Transistor (HBT)has been determined by using the analytical model previously developed for a SiGe HBT (arafatetal.). While thinking about the expansion of the SiGe BTT model for any other ternary compound semiconductor material like AlGaAs, the previous model could not be used directly because most of the parameters used in the model depend on the materials used. The novel part of the present work is that the authors investigated published literature for those parameters associated with AlGaAs and fed them into the SiGe model, determined the BTT and verified the results.
Keywords
Ge-Si alloys; III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT model; HBT; SiGe; analytical model; base transit time determination; exponentially doped base; heterojunction bipolar transistor; ternary compound semiconductor material; Doping; Heterojunction bipolar transistors; Microwave amplifiers; Microwave measurement; Silicon; Silicon germanium; Base transit time of AlGaAs; exponential doping; graded base; ternary compound semiconductor HBT;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Communication Systems (ICECS), 2014 International Conference on
Conference_Location
Coimbatore
Print_ISBN
978-1-4799-2321-2
Type
conf
DOI
10.1109/ECS.2014.6892716
Filename
6892716
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