• DocumentCode
    228649
  • Title

    Determining base transit time of anAlyGa1−yAs HBT using the analytical model developed for SiGe device with exponentially doped base

  • Author

    Arafat, Yeasir ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Jahan, Nusrat

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Bangladesh Univ. of Eng. & Tech. (BUET), Dhaka, Bangladesh
  • fYear
    2014
  • fDate
    13-14 Feb. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Base transit time (BTT) of a graded base AlGaAs Heterojunction Bipolar Transistor (HBT)has been determined by using the analytical model previously developed for a SiGe HBT (arafatetal.). While thinking about the expansion of the SiGe BTT model for any other ternary compound semiconductor material like AlGaAs, the previous model could not be used directly because most of the parameters used in the model depend on the materials used. The novel part of the present work is that the authors investigated published literature for those parameters associated with AlGaAs and fed them into the SiGe model, determined the BTT and verified the results.
  • Keywords
    Ge-Si alloys; III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT model; HBT; SiGe; analytical model; base transit time determination; exponentially doped base; heterojunction bipolar transistor; ternary compound semiconductor material; Doping; Heterojunction bipolar transistors; Microwave amplifiers; Microwave measurement; Silicon; Silicon germanium; Base transit time of AlGaAs; exponential doping; graded base; ternary compound semiconductor HBT;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Communication Systems (ICECS), 2014 International Conference on
  • Conference_Location
    Coimbatore
  • Print_ISBN
    978-1-4799-2321-2
  • Type

    conf

  • DOI
    10.1109/ECS.2014.6892716
  • Filename
    6892716