• DocumentCode
    2286808
  • Title

    On performances of wavelet modulated three phase AC-DC converters

  • Author

    Saleh, S.A.

  • Author_Institution
    Marine Inst., Memorial Univ. of Newfoundland, St. John´´s, NL, Canada
  • fYear
    2011
  • fDate
    9-13 Oct. 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents the implementation and performance testing of the wavelet modulation technique for three phase, 6-pulse, voltage source ac-dc converters. The wavelet modulation technique is based on utilizing sets of scale-based linearly-combined wavelet scaling and synthesis basis functions in order to construct a non-dyadic type multiresolution analysis (MRA). The analysis part of the constructed MRA creates three sets of groups of non-uniform recurrent samples from a reference dc signal. The synthesis part of the constructed MRA generates switching signals for operating the three phase ac-dc converter to synthesize the reference dc signal on its output side. The wavelet modulation technique is implemented for performance testing, when operating three phase ac-dc converters. Test results show that the wavelet modulation technique is capable of operating three-phase, 6-pulse, voltage source ac-dc converters to produce outputs with high dc components and reduced harmonic contents, while maintaining close-to-sinusoidal input currents at a nearunity power factor.
  • Keywords
    AC-DC power convertors; harmonics suppression; power conversion harmonics; wavelet transforms; 6-pulse voltage source AC-DC converters; MRA; close-to-sinusoidal input currents; harmonic content reduction; near-unity power factor; nondyadic-type multiresolution analysis; nonuniform recurrent samples; performance testing; reference DC signal; scale-based linearly-combined wavelet scaling function; switching signals; synthesis basis function; three-phase AC-DC converters; wavelet modulation technique; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting (IAS), 2011 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4244-9498-9
  • Type

    conf

  • DOI
    10.1109/IAS.2011.6074400
  • Filename
    6074400