DocumentCode
2287151
Title
Fabrication of long tip AFM probes for highly coarse samples
Author
Kang, Hyen-Wook ; Kawashima, Yoshiteru ; Muramatsu, Hiroshi
Author_Institution
Sch. of Biosci. & Biotechnol., Tokyo Univ. of Technol., Tokyo, Japan
fYear
2010
fDate
17-20 Aug. 2010
Firstpage
386
Lastpage
389
Abstract
A long polymeric tip has been fabricated for AFM measurements, which is able to image large and highly coarse objects such as biological and food samples. Two-photon adsorbed photo-polymerization technique provides a long polymeric tip onto a commercial cantilever. The length of the long polymeric tip was 90μm. Brown rice flours with ~3μm diameter were imaged using the fabricated long tip. The result AFM image clearly showed coarse surface, which cannot be approached by a commercial tip. Since the fabricated tip has conical structure, a clear image of brown rice flours were achieved without sharp cliff-like patterns, which imaged by the commercial pyramidal shape tip.
Keywords
atomic force microscopy; cantilevers; micromechanical devices; photochemistry; polymers; AFM probe; brown rice flour; cantilever; long polymeric tip; long tip fabrication; size 90 mum; two photon adsorbed photopolymerization technique;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location
Seoul
ISSN
1944-9399
Print_ISBN
978-1-4244-7033-4
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2010.5697902
Filename
5697902
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