Title :
Fabrication of long tip AFM probes for highly coarse samples
Author :
Kang, Hyen-Wook ; Kawashima, Yoshiteru ; Muramatsu, Hiroshi
Author_Institution :
Sch. of Biosci. & Biotechnol., Tokyo Univ. of Technol., Tokyo, Japan
Abstract :
A long polymeric tip has been fabricated for AFM measurements, which is able to image large and highly coarse objects such as biological and food samples. Two-photon adsorbed photo-polymerization technique provides a long polymeric tip onto a commercial cantilever. The length of the long polymeric tip was 90μm. Brown rice flours with ~3μm diameter were imaged using the fabricated long tip. The result AFM image clearly showed coarse surface, which cannot be approached by a commercial tip. Since the fabricated tip has conical structure, a clear image of brown rice flours were achieved without sharp cliff-like patterns, which imaged by the commercial pyramidal shape tip.
Keywords :
atomic force microscopy; cantilevers; micromechanical devices; photochemistry; polymers; AFM probe; brown rice flour; cantilever; long polymeric tip; long tip fabrication; size 90 mum; two photon adsorbed photopolymerization technique;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-7033-4
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2010.5697902