• DocumentCode
    2287241
  • Title

    Locating the origin of feeder level harmonics utilizing remote THD measurements

  • Author

    McBee, Kerry D. ; Simoes, M.G.

  • Author_Institution
    Xcel Energy, Denver, CO, USA
  • fYear
    2011
  • fDate
    9-13 Oct. 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The drive for power delivery efficiency has led to many utility companies installing Voltage and VAr Optimization applications, which rely upon capacitor banks installed throughout a feeder to regulate voltage and substation VArs. Due to heating effects, harmonic currents that are injected by customers can inhibit the operational effectiveness of such applications. This paper describes a method for indentifying the originating locations of feeder level harmonics with the use of THD measurements retrieved remotely from capacitor banks and a single harmonic spectrum analysis. The authors utilize a simplified distribution system model to perform current injection calculations to match the measured feeder level distortion that is identified from remote monitoring. The spectrum analysis measurement is utilized to determine the individual harmonics of the THD measurements and to develop harmonic source parallel impedances. The process was applied to an existing Volt/VAr application that was frequently experiencing 9% voltage THD.
  • Keywords
    distortion measurement; harmonic distortion; optimisation; power capacitors; power system harmonics; static VAr compensators; substations; voltage control; VAr optimization; capacitor banks; current injection; feeder level harmonics; harmonic currents; power delivery; remote THD measurements; remote monitoring; simplified distribution system; single harmonic spectrum analysis; substation VArs; voltage optimization; voltage regulation; Capacitors; Educational institutions; Energy measurement; Current Injection; Harmonics; IEEE 519; THD; VAr Optimization; Voltage Optimization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting (IAS), 2011 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4244-9498-9
  • Type

    conf

  • DOI
    10.1109/IAS.2011.6074424
  • Filename
    6074424