Title :
A unified sampled-data simulation method for nonlinear circuits response, sensitivity, and stochastic behavior
Author :
Yuan, Fei ; Opal, Ajoy
Author_Institution :
Dept. of Electr. & Comput. Eng., Ryerson Univ., Toronto, Ont., Canada
Abstract :
This paper presents a new, efficient, and unified time-domain analysis method for mildly nonlinear circuits. The method characterizes nonlinear circuits using a set of Volterra circuits. The input of the first-order Volterra circuit is identical to that of the nonlinear circuit, whereas that of higher-order Volterra circuits is obtained from the response of lower-order Volterra circuits and interpolating Fourier series. The response, sensitivity, mean, and variance of the nonlinear circuit are computed at equally spaced intervals of time. The accuracy and speed of the method are examined by comparing with those of Predictor-Corrector (PC) methods for time-domain response computation, the Brute-Force (BF) methods for sensitivity analysis, and Monte Carlo (MC) simulation for statistical estimation using example circuits
Keywords :
circuit simulation; nonlinear network analysis; sensitivity analysis; statistical analysis; stochastic processes; time-domain analysis; SDSN computer program; Volterra circuits; interpolating Fourier series; mildly nonlinear circuits; response; sensitivity; statistical estimation; stochastic behavior; time-domain analysis method; unified sampled-data simulation method; Analytical models; Circuit analysis computing; Circuit simulation; Computational modeling; Fourier series; Monte Carlo methods; Nonlinear circuits; Sensitivity analysis; Stochastic processes; Time domain analysis;
Conference_Titel :
Circuits and Systems, 2001. MWSCAS 2001. Proceedings of the 44th IEEE 2001 Midwest Symposium on
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-7150-X
DOI :
10.1109/MWSCAS.2001.986107