DocumentCode :
2288307
Title :
A Complete and Fully Qualified Design Flow for Verification of Mixed-Signal SoC with Embedded Flash Memories
Author :
Daglio, Pierluigi
Author_Institution :
STMicroelectronics, Milan
Volume :
2
fYear :
2006
fDate :
6-10 March 2006
Firstpage :
1
Lastpage :
6
Abstract :
Today almost all the people in the industry are talking widely about full chip mixed-signal simulation, both in pre-layout and post-layout conditions, basically for two main reasons: a large range of applications is moving from fully digital to mixed-signal and full chip simulation with parasitic components, together with IR drop analysis, is becoming strictly mandatory before going to silicon. In fact, the cost of a mask set for a 90nm or a 65nm technology is growing in an exponential way, passing the million dollar for any single mask set. For these reasons, it is strategic to set up a very complete mixed-signal design flow allowing designers to go to the silicon in a safe way with the minimum risk of failure. Nowadays, various approaches to the same problem are pursued by different organizations, sometimes privileging the fully digital modeling of the mixed-signal system and some other times setting the digital part in VHDL and keeping the analog part at transistor level, simulating the whole chip with a mixed-signal simulator. Which is the right approach? Which are the status and the reliability of the tools on the market ? Which is the acceptable trade-off among simulation speed, code coverage and precision of simulation results? This paper tries to answer to these questions proposing a fully qualified and complete mixed-signal flow for SoC verification, implemented to design applications also containing embedded flash memories
Keywords :
circuit simulation; embedded systems; flash memories; formal verification; hardware description languages; integrated circuit design; mixed analogue-digital integrated circuits; system-on-chip; 65 nm; 90 nm; IR drop analysis; SoC; VHDL; digital modeling; embedded flash memories; mixed-signal design flow; mixed-signal simulation; mixed-signal system; reliability; verification; Analytical models; Availability; Circuit simulation; Costs; Design for manufacture; Design optimization; Flash memory; Hardware design languages; Mathematical model; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.243780
Filename :
1657121
Link To Document :
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