Title :
Automated data processing and cosmic ray mitigation of up-the-ramp sampled data [space-based observatories]
Author :
Offenberg, Joel D. ; Fixsen, Dale J. ; Sengupta, Ratnabali ; Mather, John C.
Author_Institution :
Sci. Syst. & Applications Inc., Greenbelt, MD, USA
Abstract :
The high flux of charged particles in deep space will cause significant data loss due to particle impacts. When a charged particle impacts an IR detector, it deposits a large but unknown amount of charge in the active layer. This means that the signal is effectively lost when cosmic ray or other charged particle impacts the detector. However, by reading out at regular intervals, it is possible to estimate the "typical" rate of increase for the accumulating charge, identify outliers and discard suspect intervals. The up-the-ramp approach can be used when the samples are not uniform. Up-the-ramp sampled data can be used to improve the data beyond reducing the read-noise and mitigating charged particle events. We demonstrate the effectiveness of an efficient cosmic ray rejection system utilizing up-the-ramp sampled InSb radiation test data. The method used is over 99% effective in identifying and removing cosmic rays while preserving good data, even when over 15% of the detector is impacted by cosmic rays in each sample. We also demonstrate the effectiveness of using up-the-ramp sampled data for automated data management solutions. Several approaches for performing this processing are discussed.
Keywords :
III-V semiconductors; aerospace instrumentation; astronomical instruments; astronomical telescopes; cosmic ray interactions; focal planes; indium compounds; infrared astronomy; infrared detectors; IR detector; InSb; astronomical telescope; automated data processing; cosmic ray mitigation; data management solutions; deep space; infrared astronomy; particle impacts; radiation test data; read out; reeadout; satellite instrument; space based instrument; space-based observatories; up-the-ramp sampled data; Cosmic rays; Costs; Data processing; Detectors; NASA; Observatories; Signal sampling; Signal to noise ratio; Telescopes; Uncertainty;
Conference_Titel :
Aerospace Conference Proceedings, 2002. IEEE
Print_ISBN :
0-7803-7231-X
DOI :
10.1109/AERO.2002.1035317