• DocumentCode
    2288796
  • Title

    Resilient Subclass Discriminant Analysis

  • Author

    Wu, Dijia ; Boyer, Kim L.

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    389
  • Lastpage
    396
  • Abstract
    We propose a dimension reduction technique named Resilient Subclass Discriminant Analysis (RSDA) for high dimensional classification problems. The technique iteratively estimates the subclass division by embedding the Fisher Discriminant Analysis (FDA) with Expectation-Maximization (EM) in Gaussian Mixture Models (GMM). The new method maintains the adaptability of SDA to a wide range of data distributions by approximating the distribution of each class as a mixture of Gaussians, and provides superior feature selection performance to SDA with modified EM clustering that estimates a posteriori probability of latent variables in lower-dimensional Fisher´s discriminant space, which also improves the robustness in problems of small training datasets compared with conventional EM algorithm. Extensive experiments and comparison results against other well-known Discriminant Analysis (DA) methods are presented using synthetic data, benchmark datasets as well as a real computational vision problem.
  • Keywords
    Gaussian processes; expectation-maximisation algorithm; feature extraction; iterative methods; pattern classification; Fisher discriminant analysis; Gaussian mixture model; computational vision problem; data distribution; dimension reduction technique; expectation maximization method; feature selection; high dimensional classification problems; iterative estimation; resilient subclass discriminant analysis; variables posteriori probability; Clustering algorithms; Clustering methods; Computer vision; Covariance matrix; Feature extraction; Kernel; Linear discriminant analysis; Neural networks; Pattern recognition; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459212
  • Filename
    5459212