• DocumentCode
    228892
  • Title

    Resonant electron attachment to oxygen impurities in dense Neon gas

  • Author

    Borghesani, A.F.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Padua, Padua, Italy
  • fYear
    2014
  • fDate
    June 29 2014-July 3 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Measurements of resonant electron attachment to O2 impurities in dense Ne gas at moderately low temperature T=80 K are here reported. The density-normalized attachment frequency shows a peak at a specific density. The present data are compared to previous results obtained in dense He gas at similar temperatures. Similarly to the He case, the present data are explained by assuming that the dense environment affects the energetics of the quasi-free electrons.
  • Keywords
    atom-molecule collisions; electron attachment; negative ions; neon; oxygen; Ne; O2; dense environment affects; dense neon gas; density normalized attachment frequency; oxygen impurities; quasifree electron energetics; resonant electron attachment; temperature 80 K; Atomic clocks; Density measurement; Energy measurement; Lead; Scattering; attaching impurities; electron attachment; electron swarms; multiple scattering; shifted energy distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dielectric Liquids (ICDL), 2014 IEEE 18th International Conference on
  • Conference_Location
    Bled
  • Type

    conf

  • DOI
    10.1109/ICDL.2014.6893070
  • Filename
    6893070