Title :
Flip Error Resistant Stitching in Sensor Network Localizations
Author :
Kwon, Oh-Heum ; Song, Ha-Joo
Author_Institution :
Div. of Electron., Comput., & Telecommun. Eng., Pukyong Nat. Univ., Pusan
Abstract :
In patch-and-stitch localization algorithms, a flip-error refers to the kind of error in which a patch is stitched to the map as being wrongly reflected. In this paper, we present an anchor-free localization algorithm which tries to detect and prevent flip errors. The flip error prevention is achieved by two filtering mechanisms: the flip-ambiguity test and the flip-conflict detection. We evaluate the performances of proposed techniques though simulations and show that they achieve significant performance improvements.
Keywords :
error analysis; wireless sensor networks; flip error prevention; flip error resistant stitching; flip-conflict detection; patch-and-stitch localization algorithms; sensor network localizations; Computer errors; Computer networks; Computer vision; Costs; Distributed computing; Global Positioning System; Performance evaluation; Sensor systems; Telecommunication computing; Wireless sensor networks; localization algorithm; wireless sensor network;
Conference_Titel :
Distributed Computing Systems Workshops, 2008. ICDCS '08. 28th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-3173-1
Electronic_ISBN :
1545-0678
DOI :
10.1109/ICDCS.Workshops.2008.103