DocumentCode :
2289356
Title :
Combinatorial-models and coverage: a binary decision diagram (BDD) approach
Author :
Doyle, Stacy A. ; Dugan, Joanne Bechta ; Boyd, Mark
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC, USA
fYear :
1995
fDate :
16-19 Jan 1995
Firstpage :
82
Lastpage :
89
Abstract :
This paper presents the DREDD (Dependability and Risk Analysis using Decision Diagrams) algorithm which incorporates coverage modeling into a BDD solution of a combinatorial model. The DREDD algorithm takes advantage of the efficiency of the BDD solution approach and the increased accuracy afforded by coverage modeling. BDDs have been used to find exact solutions for extremely large systems, including those with as many as 1020 prime implicants. Including coverage in this process will increase the validity of the results, since a more complete model allows for more realistic analysis. The reliability of life critical systems which previously could only be approximated may now be analyzed more accurately
Keywords :
combinatorial mathematics; failure analysis; reliability theory; risk management; Decision Diagrams; Dependability; Risk Analysis; binary decision diagram; combinatorial-models; coverage; life critical systems; reliability; Binary decision diagrams; Boolean functions; Circuit faults; Control systems; Data structures; Error correction; Fault tolerant systems; Fault trees; NASA; Risk analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
ISSN :
0149-144X
Print_ISBN :
0-7803-2470-6
Type :
conf
DOI :
10.1109/RAMS.1995.513227
Filename :
513227
Link To Document :
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