Combinatorial-models and coverage: a binary decision diagram (BDD) approach

Author

Doyle, Stacy A. ; Dugan, Joanne Bechta ; Boyd, Mark

Author_Institution

Dept. of Comput. Sci., Duke Univ., Durham, NC, USA

fYear

1995

fDate

16-19 Jan 1995

Firstpage

82

Lastpage

89

Abstract

This paper presents the DREDD (Dependability and Risk Analysis using Decision Diagrams) algorithm which incorporates coverage modeling into a BDD solution of a combinatorial model. The DREDD algorithm takes advantage of the efficiency of the BDD solution approach and the increased accuracy afforded by coverage modeling. BDDs have been used to find exact solutions for extremely large systems, including those with as many as 10²⁰ prime implicants. Including coverage in this process will increase the validity of the results, since a more complete model allows for more realistic analysis. The reliability of life critical systems which previously could only be approximated may now be analyzed more accurately

Keywords

combinatorial mathematics; failure analysis; reliability theory; risk management; Decision Diagrams; Dependability; Risk Analysis; binary decision diagram; combinatorial-models; coverage; life critical systems; reliability; Binary decision diagrams; Boolean functions; Circuit faults; Control systems; Data structures; Error correction; Fault tolerant systems; Fault trees; NASA; Risk analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 1995. Proceedings., Annual

Conference_Location

Washington, DC

ISSN

0149-144X

Print_ISBN

0-7803-2470-6

Type

conf

DOI

10.1109/RAMS.1995.513227

Filename

513227