DocumentCode :
2289432
Title :
Framework for a dual-use reliability program standard
Author :
Knowles, Ian ; Malhotra, Anupam ; Stadterman, Thomas J. ; Munamarty, Ramesh
Author_Institution :
Directorate of Reliability, London, UK
fYear :
1995
fDate :
16-19 Jan 1995
Firstpage :
102
Lastpage :
105
Abstract :
Technology today is such that the user, or customer, is not able to specify how a product should be developed. The responsibility of developing a reliable product must be placed on the supplier, instead of the customer. This idea should not be new. Military contractors have been saying that the government imposes too many requirements that inhibit innovative design, and often adds cost, with the result being an inferior product. This paper outlines the framework for a next-generation, reliability program standard based on a “code of practice”. In this framework, the customer specifies the performance of the product, without stipulating how the supplier must develop, engineer and test the product. The supplier, however, must show that they understand the needs of the customer, can determine the appropriate processes to meet those needs, and can assure the customer that those needs are met. This approach allows the supplier to be flexible and innovative, as long as the customer´s needs are met. The Institute of Electrical and Electronics Engineers (IEEE) has initiated an effort to develop a reliability program standard which incorporates these concepts
Keywords :
product development; reliability; R&M program; dual-use reliability program standard; maintenance; military contractors; product development; program management; program planning; reliability managment; reliability planning; reliability program; Consumer electronics; Costs; Educational institutions; Electronics packaging; Government; Maintenance; Military standards; Product development; Reliability engineering; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
ISSN :
0149-144X
Print_ISBN :
0-7803-2470-6
Type :
conf
DOI :
10.1109/RAMS.1995.513230
Filename :
513230
Link To Document :
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