• DocumentCode
    2289432
  • Title

    Framework for a dual-use reliability program standard

  • Author

    Knowles, Ian ; Malhotra, Anupam ; Stadterman, Thomas J. ; Munamarty, Ramesh

  • Author_Institution
    Directorate of Reliability, London, UK
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    102
  • Lastpage
    105
  • Abstract
    Technology today is such that the user, or customer, is not able to specify how a product should be developed. The responsibility of developing a reliable product must be placed on the supplier, instead of the customer. This idea should not be new. Military contractors have been saying that the government imposes too many requirements that inhibit innovative design, and often adds cost, with the result being an inferior product. This paper outlines the framework for a next-generation, reliability program standard based on a “code of practice”. In this framework, the customer specifies the performance of the product, without stipulating how the supplier must develop, engineer and test the product. The supplier, however, must show that they understand the needs of the customer, can determine the appropriate processes to meet those needs, and can assure the customer that those needs are met. This approach allows the supplier to be flexible and innovative, as long as the customer´s needs are met. The Institute of Electrical and Electronics Engineers (IEEE) has initiated an effort to develop a reliability program standard which incorporates these concepts
  • Keywords
    product development; reliability; R&M program; dual-use reliability program standard; maintenance; military contractors; product development; program management; program planning; reliability managment; reliability planning; reliability program; Consumer electronics; Costs; Educational institutions; Electronics packaging; Government; Maintenance; Military standards; Product development; Reliability engineering; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513230
  • Filename
    513230