DocumentCode
2289561
Title
Estimation of the coverage probabilities by 3-stage sampling
Author
Constantinescu, Cristian
Author_Institution
Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
fYear
1995
fDate
16-19 Jan 1995
Firstpage
132
Lastpage
136
Abstract
Development of fault-tolerant computing systems requires accurate reliability assessment techniques. Usually, the reliability measures are functions of component failure rates and fault coverage probabilities. Coverage provides information about the fault and error detection, isolation and system recovery capabilities. This parameter can be estimated by physical or simulated fault injection. One of the most difficult problems the analyst has to deal with, throughout the fault injection process, is the largeness of the fault space. This paper addresses the problem of inferring the coverage probabilities from the information gathered in physical or simulated fault injection experiments. A 3-stage sampling technique is developed for coping with the largeness of the fault space. Statistical experiments are carried out in a three-dimensional fault space which takes into account the inputs applied to the system, fault occurrence times and fault locations
Keywords
failure analysis; fault tolerant computing; probability; reliability; reliability theory; system recovery; component failure rates; coverage probabilities estimation; error detection; fault coverage; fault detection; fault injection; fault isolation; fault locations; fault occurrence times; fault-tolerant computing systems; reliability assessment; system recovery; three-dimensional fault space; three-stage sampling; Analytical models; Circuit faults; Circuit simulation; Computational modeling; Fault location; Fault tolerant systems; Hardware design languages; Probability; Sampling methods; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location
Washington, DC
ISSN
0149-144X
Print_ISBN
0-7803-2470-6
Type
conf
DOI
10.1109/RAMS.1995.513236
Filename
513236
Link To Document