DocumentCode :
2289592
Title :
Analysis techniques for real-time, fault-tolerant, VLSI processing arrays
Author :
Schwab, Andrew J. ; Johnson, Barry W. ; Dugan, Joanne Bechta
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
fYear :
1995
fDate :
16-19 Jan 1995
Firstpage :
137
Lastpage :
143
Abstract :
Several techniques are described for the quantitative evaluation of the effectiveness of various reconfiguration strategies for real-time, VLSI processing arrays. The first technique illustrates the advantages of small, easily managed semi-Markov models for comparing important events in the fault/error process of a system. Since these events have the greatest impact on architecture selection in a real-time system, a methodology that quantifies system differences is necessary to properly design a real-time processing array. The second technique developed for this research expands the previous concept to include the events within a single time interval in a real-time system. The single interval model provides unique information on critical real-time design issues. It quantitatively describes the effects of time-outs on the failure probability of potential reconfiguration strategies. The interaction of sampling rate and failures due to time-outs is clarified with this model. The ability to recover from faults at different points within an interval is also estimated
Keywords :
Markov processes; VLSI; fault tolerant computing; integrated circuit reliability; parallel processing; probability; real-time systems; reliability theory; system recovery; VLSI processing arrays; architecture selection; failure probability; fault models; fault recovery; fault-tolerance; real-time circuits; reconfiguration strategies; reliability; sampling rate; semi-Markov models; single interval model; time-outs; Circuit faults; Costs; Fault tolerance; Integrated circuit reliability; Process design; Production; Real time systems; Redundancy; Sampling methods; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
ISSN :
0149-144X
Print_ISBN :
0-7803-2470-6
Type :
conf
DOI :
10.1109/RAMS.1995.513237
Filename :
513237
Link To Document :
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