• DocumentCode
    2289609
  • Title

    Color Effect on the Face Recognition with Spatial Resolution Constraints

  • Author

    Choi, Jae Young ; Yang, Seungji ; Ro, Yong Man ; Plataniotis, Konstantinos N.

  • Author_Institution
    Image & Video Syst. Lab., Inf. & Commun. Univ., Daejeon
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    294
  • Lastpage
    301
  • Abstract
    In the practical face recognition (FR) applications, low-resolution faces (20 times 20 pixels or less) are commonly encountered and negatively impact on reliable performance. To overcome low-resolution face problem, we show that face color can significantly improve the performance compared to intensity-based features. The contribution of this paper is twofold. First, a new metric called dasiavariation ratio gainpsila (VRG) is proposed to theoretically prove the significance of color effect on low-resolution faces. Second, we conduct extensive performance comparison studies. In particular, 3,192 color facial images corresponding to 341 subjects, collected from three standard CMU PIE, FERET, and XM2VTSDB face databases, were used to perform comparative studies of color effect on various face resolutions. Experimental results verified that face color feature improves the degraded recognition rate due to low-resolution faces by at least an order of magnitude over intensity-based features.
  • Keywords
    face recognition; image colour analysis; image resolution; CMU PIE; FERET; XM2VTSDB face databases; color effect; face recognition; intensity-based features; low-resolution faces; spatial resolution constraints; variation ratio gain; Degradation; Face detection; Face recognition; Gray-scale; Image color analysis; Linear discriminant analysis; Principal component analysis; Reluctance generators; Robustness; Spatial resolution; Color face recognition; Face resolution; Identification; Variation ratio gain; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia, 2008. ISM 2008. Tenth IEEE International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    978-0-7695-3454-1
  • Electronic_ISBN
    978-0-7695-3454-1
  • Type

    conf

  • DOI
    10.1109/ISM.2008.22
  • Filename
    4741183