• DocumentCode
    2289647
  • Title

    Towards robust design of hybrid CMOS-SETs using feedback architectures

  • Author

    Deng, Guoqing ; Chen, Chunhong

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Windsor, Windsor, ON, Canada
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    1125
  • Lastpage
    1129
  • Abstract
    Low temperature operation and background charge fluctuation are among critical limitations for practical single-electron-tunneling (or SET) based circuits. Particularly, background charges on the island of SET devices affect the phase of Coulomb blockade oscillation, and may eventually lead to incorrect circuit operation. In order to construct robust SET circuits, we explore new design methods based on feedback architectures and novel characteristics of SET devices. We first discuss the impact of a direct feedback on circuit performance against background charges. Then, we propose a self-adapted input-referred feedback structure which can drastically reduce the sensitivity of circuit behaviors to background charge fluctuations. An improved hybrid CMOS-SET ADC circuit is also presented as an example to take advantage of the proposed feedback architecture for robustness against random background charges.
  • Keywords
    CMOS integrated circuits; Coulomb blockade; analogue-digital conversion; feedback; integrated circuit design; single electron devices; tunnelling; Coulomb blockade oscillation; charge fluctuation; feedback architectures; hybrid CMOS-SET; low temperature operation; self-adapted input-referred feedback structure; single-electron-tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5698032
  • Filename
    5698032