DocumentCode :
2289649
Title :
On reliability growth testing
Author :
Demko, Edward
Author_Institution :
Grumman Melbourne Syst. Div., Melbourne, FL, USA
fYear :
1995
fDate :
16-19 Jan 1995
Firstpage :
162
Lastpage :
165
Abstract :
Reliability development growth testing (RDGT) is the most common method used to improve equipment reliability. The author had an opportunity to perform an analysis of hardware that experienced environmental stress screening (ESS), environmental qualification testing (EQT), RDGT and field usage. The failure mode and corrective action data were used to qualitatively assess the effectiveness of RDGT testing. The results of this analysis yield the following conclusions: (1) RDGT is not a very good precipitator of field related failure modes, therefore RDGT alone does not appear to be a strong driver of reliability growth; (2) RDGT, EQT, ESS, and EQT tests precipitate a high percentage of failure modes that occur only in “chamber-type” environments, and are not related to field use; (3) of the three “chamber-type” tests (ESS, RDGT, and EQT) evaluated as precipitators of field related failure modes, ESS appears to be the most effective; and (4) “chamber-type” tests are more efficient in developing corrective actions than field operation
Keywords :
environmental stress screening; failure analysis; reliability; testing; chamber-type environment; corrective action; environmental qualification testing; environmental stress screening; equipment reliability; failure mode; field operation; hardware; reliability development growth testing; Aerospace electronics; Electronic switching systems; Failure analysis; Hardware; Pattern analysis; Performance analysis; Performance evaluation; Qualifications; Stress; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location :
Washington, DC
ISSN :
0149-144X
Print_ISBN :
0-7803-2470-6
Type :
conf
DOI :
10.1109/RAMS.1995.513241
Filename :
513241
Link To Document :
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