• DocumentCode
    2289763
  • Title

    Sparsity induced similarity measure for label propagation

  • Author

    Cheng, Hong ; Liu, Zicheng ; Yang, Jie

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    317
  • Lastpage
    324
  • Abstract
    Graph-based semi-supervised learning has gained considerable interests in the past several years thanks to its effectiveness in combining labeled and unlabeled data through label propagation for better object modeling and classification. A critical issue in constructing a graph is the weight assignment where the weight of an edge specifies the similarity between two data points. In this paper, we present a novel technique to measure the similarities among data points by decomposing each data point as an L1 sparse linear combination of the rest of the data points. The main idea is that the coefficients in such a sparse decomposition reflect the point´s neighborhood structure thus providing better similarity measures among the decomposed data point and the rest of the data points. The proposed approach is evaluated on four commonly-used data sets and the experimental results show that the proposed Sparsity Induced Similarity (SIS) measure significantly improves label propagation performance. As an application of the SIS-based label propagation, we show that the SIS measure can be used to improve the Bag-of-Words approach for scene classification.
  • Keywords
    learning (artificial intelligence); pattern recognition; bag-of-words approach; graph-based semi-supervised learning; label propagation; scene classification; sparse decomposition; sparse linear combination; sparsity induced similarity measure; Euclidean distance; Gain measurement; Kernel; Layout; Nearest neighbor searches; Pattern recognition; Phase estimation; Phase measurement; Semisupervised learning; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459267
  • Filename
    5459267