Title :
Optimal-weights sensors-measurement fusion using genetic algorithms
Author :
Sharawi, Mohammad S. ; Abdel-Aty-Zohdy, Hoda S. ; Ewing, Robert L.
Author_Institution :
Dept. of Electr. & Syst. Eng., Oakland Univ., Rochester, MI, USA
Abstract :
Although there are many simulated Genetic Algorithms (GAs) in applications, less research has been directed toward their practical hardware implementations. In this paper we present a GA for optimum sensors-measurement fusion and characteristic weights. A multilevel verification of the GA is performed via the Mentor Graphics Design Architect (DA) and ModelSim CAD tools. In particular the design of efficient universal multipliers, dividers, and their integrated circuits is addressed. Effective mutation and crossover approach has been implemented in the GA system operation. It requires 960 clock cycles for complete iteration of 64 chromosomes, each with 3 genes of two binary-bits. This requires only 12 μsec when implemented in the 0.25 μm CMOS technology. The GA system is developed for a preprocessing unit to select optimal weights from real-time sensors measurement, and for fused measurements as in an electronic nose, integrated accelerometer systems, and for performance enhancement of recurrent dynamic neural networks in noisy environments. The proposed approach, simulation results, and possible experimental results are presented
Keywords :
CMOS digital integrated circuits; formal verification; genetic algorithms; real-time systems; sensor fusion; 0.25 micron; 12 mus; CMOS technology; Mentor Graphics Design Architect tool; ModelSim CAD tool; VHDL; chromosome generator; fused measurements; genetic algorithms; integrated accelerometer systems; integrated circuits; multilevel verification; mutation/crossover approach; noisy environments; optimal-weights sensors-measurement fusion; real-time sensor measurement; recurrent dynamic neural networks; universal dividers; universal multipliers; Biological cells; CMOS technology; Clocks; Design automation; Genetic algorithms; Genetic mutations; Graphics; Hardware; Integrated circuit technology; Real time systems;
Conference_Titel :
Circuits and Systems, 2001. MWSCAS 2001. Proceedings of the 44th IEEE 2001 Midwest Symposium on
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-7150-X
DOI :
10.1109/MWSCAS.2001.986248