DocumentCode :
2289886
Title :
CT saturation calculations - are they applicable in the modern world? Part 1, the question
Author :
Cosse, Roy E., Jr. ; Dunn, Donald G. ; Spiewak, Robert M.
Author_Institution :
Powell Electr. Syst. Inc., Houston, TX, USA
fYear :
2005
fDate :
12-14 Sept. 2005
Firstpage :
287
Lastpage :
296
Abstract :
Previously, ANSI/IEEE relay current transformer (CT) sizing criteria was based on traditional symmetrical calculations usually discussed by technical articles and manufacturers´ guidelines. In 1996, IEEE Standard C37.110-7996 introduced (1 + X/R) offset multiplying, current asymmetry and current distortion factors; officially changing the CT sizing guideline. A critical concern is the performance of fast protective schemes (instantaneous or differential elements) during severe saturation of low ratio CTs. Will the instantaneous element operate before the upstream breaker relay trips? Will the differential element mis-operate for out-of-zone faults? The use of electromagnetic and analog relay technology does not assure selectivity. Modern microprocessor relays introduce additional uncertainty into the design/verification process with different sampling techniques and proprietary sensing/recognition/trip algorithms. This paper discusses the application of standard CT accuracy classes with modern ANSI/IEEE CT calculation methodology. This paper is the first of a two-part series; Part II, the Findings provides analytical waveform analysis discussions to illustrate the concepts conveyed in Part I.
Keywords :
IEEE standards; current transformers; relays; transformer protection; ANSI/IEEE CT calculation methodology; CT saturation calculations; IEEE Standard C37.110-7996; current asymmetry; current distortion factors; current transformer; microprocessor relays; offset multiplying; sampling techniques; Circuit faults; Current transformers; Fault currents; Guidelines; Manufacturing; Microprocessors; Protection; Protective relaying; Relays; Uncertainty; Accuracy Class; Asymmetrical Current; CT Burden; CT Saturation; DC Offset; Digital Filter; X/R ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Petroleum and Chemical Industry Conference, 2005. Industry Applications Society 52nd Annual
ISSN :
0090-3507
Print_ISBN :
0-7803-9272-8
Type :
conf
DOI :
10.1109/PCICON.2005.1524565
Filename :
1524565
Link To Document :
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